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Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area.

Maria Toledano-LuquePeter C. PaliwodaMohamed NourThomas KaueraufByoung MinGermain BossuMahesh SiddabathulaTanya Nigam
Published in: IRPS (2021)
Keyphrases
  • data structure
  • data processing
  • state space
  • database
  • rapid development
  • key technologies
  • computer vision
  • case study
  • probabilistic model
  • cost effective