Tanya Nigam

Publication Activity (10 Years)

Years Active: 1999-2022
Publications (10 Years): 9

Top Topics

Reliability Analysis

Emerging Technologies

Power Management

Top Venues

Publications

Salvatore Cimino, J. Singh, J. B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, M. Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib
Optimized LDMOS Offering for Power Management and RF Applications. IRPS (2022)
Wen Liu, Dimitris P. Ioannou, Johnatan Kantarovsky, Byoung Min, Tanya Nigam
Robust Off-State TDDB Reliability of n-LDMOS. IRPS (2022)
Maria Toledano-Luque, Peter C. Paliwoda, Mohamed Nour, Thomas Kauerauf, Byoung Min, Germain Bossu, Mahesh Siddabathula, Tanya Nigam
Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. IRPS (2021)
Wafa Arfaoui, Germain Bossu, A. Muehlhoff, D. Lipp, R. Manuwald, T. Chen, Tanya Nigam, Mahesh Siddabathula
A Novel HCI Reliability Model for RF/mmWave Applications in FDSOI Technology. IRPS (2020)
Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, F. Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, O. H. Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart Rauch, B. Min
Self-heating characterization and its applications in technology development. NATW (2020)
M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS (2019)
P. Srinivasan, Rakesh Ranjan, S. Cimino, A. Zainuddin, B. Kannan, L. Pantisano, I. Mahmud, G. Dilliway, Tanya Nigam
Understanding gate metal work function (mWF) impact on device reliability - A holistic approach. IRPS (2018)
Andreas Kerber, Tanya Nigam
Bias temperature instability in scaled CMOS technologies: A circuit perspective. Microelectron. Reliab. 81 (2018)
Tanya Nigam, Andreas Kerber, T. Shen, Rakesh Ranjan, L. Cao
Material and device innovation impact on reliability for scaled CMOS technologies. ESSDERC (2017)
Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen
Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. IRPS (2015)
Tanya Nigam, Andreas Kerber
Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective. ISVLSI (2015)
S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam
HTOL SRAM Vmin shift considerations in scaled HKMG technologies. CICC (2014)
Tanya Nigam, Andreas Kerber
Reliability modeling of HK MG technologies. CICC (2014)
Tanya Nigam
CMOS reliability: From discrete device degradation to circuit aging. VLSI-DAT (2013)
Tanya Nigam
Impact of Transistor Level degradation on product reliability. CICC (2009)
Marc M. Heyns, Twan Bearda, Ingrid Cornelissen, Stefan De Gendt, Robin Degraeve, Guido Groeseneken, Conny Kenens, D. Martin Knotter, Lee M. Loewenstein, Paul W. Mertens, Sofie Mertens, Marc Meuris, Tanya Nigam, Marc Schaekers, Ivo Teerlinck, Wilfried Vandervorst, Rita Vos, Klaus Wolke
Cost-effective cleaning and high-quality thin gate oxides. IBM J. Res. Dev. 43 (3) (1999)