Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.
Yoann Mamy RandriamihajaWilliam McMahonS. BalasubramanianTanya NigamBiju ParameshwaranRandy W. MannTorsten KlickT. SchaeferA. KumarY. SongVivek JoshiRakesh RanjanF. ChenPublished in: IRPS (2015)