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Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing.

Yoann Mamy RandriamihajaWilliam McMahonS. BalasubramanianTanya NigamBiju ParameshwaranRandy W. MannTorsten KlickT. SchaeferA. KumarY. SongVivek JoshiRakesh RanjanF. Chen
Published in: IRPS (2015)
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