Randy W. Mann

Publication Activity (10 Years)

Years Active: 1995-2020
Publications (10 Years): 6

Top Topics

Body Sensor Networks

Spatially Distributed

Moving Platform

Top Venues

IEEE Trans. Very Large Scale Integr. Syst.

J. Low Power Electron.

Publications

Randy W. Mann, Meixiong Zhao, Oh Sung Kwon, Xi Cao, Sanjay Parihar, Muhammed Ahosan Ul Karim, Jack M. Higman, Joseph Versaggi, Rick Carter
Bias-Dependent Variation in FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 28 (5) (2020)
Randy W. Mann, Meixiong Zhao, Sanjay Parihar, Qun Gao, Ankur Arya, Carl Radens, Shesh Mani Pandey, Joseph Versaggi, Jack M. Higman, Rick Carter
An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM. IEEE Trans. Very Large Scale Integr. Syst. 27 (8) (2019)
Bipul C. Paul, Ajey P. Jacob, William Taylor, Randy W. Mann, Joseph Versaggi, Edward J. Nowak, Lars W. Liebmann
A Retrospective View on the Technology Evolution to Support Low Power Mobile Application. J. Low Power Electron. 14 (3) (2018)
Randy W. Mann, Sandeep Puri, Sheng Xie, Daniel Marienfeld, Joseph Versaggi, Bianzhu Fu, Michael Gribelyuk, Ratheesh R. Thankalekshmi, Xiaoqiang Zhang, Hui Zang, Chad E. Weintraub
Array Termination Impacts in Advanced SRAM. IEEE Trans. Very Large Scale Integr. Syst. 25 (9) (2017)
Harsh N. Patel, Benton H. Calhoun, Randy W. Mann
Soft errors: Reliability challenges in energy-constrained ULP body sensor networks applications. IOLTS (2017)
Randy W. Mann, William McMahon, Yoann Mamy Randriamihaja, Yuncheng Song, Ajay Anand Kallianpur, Sheng Xie, Akhilesh Gautam, Joseph Versaggi, Biju Parameshwaran, Chad E. Weintraub
Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays. IEEE Trans. Very Large Scale Integr. Syst. 25 (2) (2017)
Yoann Mamy Randriamihaja, William McMahon, S. Balasubramanian, Tanya Nigam, Biju Parameshwaran, Randy W. Mann, Torsten Klick, T. Schaefer, A. Kumar, Y. Song, Vivek Joshi, Rakesh Ranjan, F. Chen
Assessing intrinsic and extrinsic end-of-life risk using functional SRAM wafer level testing. IRPS (2015)
S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam
HTOL SRAM Vmin shift considerations in scaled HKMG technologies. CICC (2014)
Randy W. Mann, Terry B. Hook, Phung T. Nguyen, Benton H. Calhoun
Nonrandom Device Mismatch Considerations in Nanoscale SRAM. IEEE Trans. Very Large Scale Integr. Syst. 20 (7) (2012)
Stuart N. Wooters, Adam C. Cabe, Zhenyu Qi, Jiajing Wang, Randy W. Mann, Benton H. Calhoun, Mircea R. Stan, Travis N. Blalock
Tracking On-Chip Age Using Distributed, Embedded Sensors. IEEE Trans. Very Large Scale Integr. Syst. 20 (11) (2012)
Randy W. Mann, Benton H. Calhoun
New category of ultra-thin notchless 6T SRAM cell layout topologies for sub-22nm. ISQED (2011)
Randy W. Mann, Satyanand Nalam, Jiajing Wang, Benton H. Calhoun
Limits of bias based assist methods in nano-scale 6T SRAM. ISQED (2010)
Jiajing Wang, Satyanand Nalam, Zhenyu Qi, Randy W. Mann, Mircea R. Stan, Benton H. Calhoun
Improving SRAM Vmin and yield by using variation-aware BTI stress. CICC (2010)
Benton H. Calhoun, Sudhanshu Khanna, Randy W. Mann, Jiajing Wang
Sub-threshold Circuit Design with Shrinking CMOS Devices. ISCAS (2009)
Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus
Ultralow-power SRAM technology. IBM J. Res. Dev. 47 (5-6) (2003)
Stephen V. Kosonocky, Michael Immediato, Peter E. Cottrell, Terence B. Hook, Randy W. Mann, Jeff Brown
Enchanced multi-threshold (MTCMOS) circuits using variable well bias. ISLPED (2001)
Randy W. Mann, Larry A. Clevenger, Paul D. Agnello, Francis R. White
Silicides and local interconnections for high-performance VLSI applications. IBM J. Res. Dev. 39 (4) (1995)
Charles W. Koburger III, William F. Clark, James W. Adkisson, Eric Adler, Paul E. Bakeman, Albert S. Bergendahl, Alan B. Botula, W. Chang, Bijan Davari, John H. Givens, Howard H. Hansen, Steven J. Holmes, David V. Horak, Chung Hon Lam, Jerome B. Lasky, Stephen E. Luce, Randy W. Mann, Glen L. Miles, James S. Nakos, Edward J. Nowak, Ghavam Shahidi, Yuan Taur, Francis R. White, Matthew R. Wordeman
A half-micron CMOS logic generation. IBM J. Res. Dev. 39 (1-2) (1995)