An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.
Randy W. MannMeixiong ZhaoSanjay PariharQun GaoAnkur AryaCarl RadensShesh Mani PandeyJoseph VersaggiJack M. HigmanRick CarterPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2019)