Sign in

An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.

Randy W. MannMeixiong ZhaoSanjay PariharQun GaoAnkur AryaCarl RadensShesh Mani PandeyJoseph VersaggiJack M. HigmanRick Carter
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2019)
Keyphrases
  • power consumption
  • learning algorithm
  • data structure
  • steady state
  • camera calibration
  • learning mechanism
  • mechanism design
  • selection mechanism