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Jack M. Higman
Publication Activity (10 Years)
Years Active: 1993-2020
Publications (10 Years): 4
Top Topics
High Throughput
Trade Off
Advanced Technology
Selection Mechanism
Top Venues
IEEE Trans. Very Large Scale Integr. Syst.
IRPS
IEEE Access
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Publications
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Randy W. Mann
,
Meixiong Zhao
,
Oh Sung Kwon
,
Xi Cao
,
Sanjay Parihar
,
Muhammed Ahosan Ul Karim
,
Jack M. Higman
,
Joseph Versaggi
,
Rick Carter
Bias-Dependent Variation in FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
28 (5) (2020)
Gobinda Saha
,
Zhewei Jiang
,
Sanjay Parihar
,
Xi Cao
,
Jack M. Higman
,
Muhammed Ahosan Ul Karim
An Energy-Efficient and High Throughput in-Memory Computing Bit-Cell With Excellent Robustness Under Process Variations for Binary Neural Network.
IEEE Access
8 (2020)
Randy W. Mann
,
Meixiong Zhao
,
Sanjay Parihar
,
Qun Gao
,
Ankur Arya
,
Carl Radens
,
Shesh Mani Pandey
,
Joseph Versaggi
,
Jack M. Higman
,
Rick Carter
An Extrinsic Device and Leakage Mechanism in Advanced Bulk FinFET SRAM.
IEEE Trans. Very Large Scale Integr. Syst.
27 (8) (2019)
Xiaoyuan Qi
,
Raymond J. Rosner
,
John Hopkins
,
Jack M. Higman
,
Rick Mewhirter
,
Aaron Sinnott
,
Binod Kumar G. Nair
,
Ishtiaq Ahsan
,
Mark Lagus
A Simplified Yield Model for SRAM Repair in Advanced Technology.
IEEE Trans. Very Large Scale Integr. Syst.
26 (11) (2018)
David Burnett
,
Sriram Balasubramanian
,
Vivek Joshi
,
Sanjay Parihar
,
Jack M. Higman
,
C. Weintraub
SRAM Vmax stability considerations.
IRPS
(2015)
Antonio Abramo
,
Franco Venturi
,
Enrico Sangiorgi
,
Jack M. Higman
,
Bruno Riccò
A numerical method to compute isotropic band models from anisotropic semiconductor band structures.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.
12 (9) (1993)