A Simplified Yield Model for SRAM Repair in Advanced Technology.
Xiaoyuan QiRaymond J. RosnerJohn HopkinsJack M. HigmanRick MewhirterAaron SinnottBinod Kumar G. NairIshtiaq AhsanMark LagusPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2018)
Keyphrases
- computational model
- advanced technology
- probabilistic model
- formal model
- neural network model
- mathematical model
- theoretical framework
- parameter estimation
- prior knowledge
- input data
- cost function
- sensitivity analysis
- data sets
- information technology
- computer science
- decision trees
- metadata
- information systems
- artificial intelligence
- machine learning
- neural network