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Bias-Dependent Variation in FinFET SRAM.

Randy W. MannMeixiong ZhaoOh Sung KwonXi CaoSanjay PariharMuhammed Ahosan Ul KarimJack M. HigmanJoseph VersaggiRick Carter
Published in: IEEE Trans. Very Large Scale Integr. Syst. (2020)
Keyphrases
  • power consumption
  • trade off
  • data transmission
  • databases
  • reinforcement learning
  • digital libraries
  • variance reduction
  • computer vision
  • artificial neural networks