Andreas Kerber

Publication Activity (10 Years)

Years Active: 2014-2018
Publications (10 Years): 5

Top Topics

Emerging Technologies

Scanning Devices

Top Venues

Microelectron. Reliab.

Publications

Andreas Kerber, Tanya Nigam
Bias temperature instability in scaled CMOS technologies: A circuit perspective. Microelectron. Reliab. 81 (2018)
Wen Liu, Andreas Kerber, Fernando Guarin, Claude Ortolland
Cap layer and multi-work-function tuning impact on TDDB/BTI in SOI FinFET devices. IRPS (2018)
Tanya Nigam, Andreas Kerber, T. Shen, Rakesh Ranjan, L. Cao
Material and device innovation impact on reliability for scaled CMOS technologies. ESSDERC (2017)
Andreas Kerber
Assessment of sense measurement duration on BTI degradation in MG/HK CMOS technologies using a novel stacked transistor test structure. Microelectron. Reliab. 73 (2017)
Tanya Nigam, Andreas Kerber
Enabling Scaling of Advanced CMOS Technologies: A Reliability Perspective. ISVLSI (2015)
S. Balasubramanian, Vivek Joshi, Torsten Klick, Randy W. Mann, Joseph Versaggi, Akhilesh Gautam, C. Weintraub, G. Kurz, G. Krause, Andreas Kerber, Biju Parameshwaran, Tanya Nigam
HTOL SRAM Vmin shift considerations in scaled HKMG technologies. CICC (2014)
Tanya Nigam, Andreas Kerber
Reliability modeling of HK MG technologies. CICC (2014)