SCANNING DEVICES
Experts
- Jianyu Yang
- Dingyi Fang
- Xiaojiang Chen
- Yulin Huang
- Stylianos I. Venieris
- Siyang Zuo
- Royson Lee
- Takanori Suzuki
- Hongbo Jiang
- Jie Xiong
- Nicholas D. Lane
- Koichiro Adachi
- Shigehisa Tanaka
- Ju Wang
- Yuebo Zha
- Benjamin Billot
- Johannes Schöning
- Barclay Jumet
- Nathan F. Lepora
- Clemens Nylandsted Klokmose
- Marcelo V. Garcia
- Tomoya Yoshida
- Lukasz Dudziak
- Gaurav Kumar
- Roberto Scopigno
- Pramodchandran N. Variyam
- Yong Zhou
- Jana Dittmann
- Claus Vielhauer
- V. P. Mahadevan Pillai
- Mark W. Schara
- John Conklin
- Philipp H. Kindt
- Colin O'Flynn
- Takashi Inoue
- Luis I. Minchala
- Abhijit Chatterjee
- Aniruddha Sinha
- Yijiong Lin
Venues
- Sensors
- CoRR
- IEEE Trans. Instrum. Meas.
- IEEE Access
- EMBC
- NEMS
- Remote. Sens.
- Proc. IEEE
- Comput. Electron. Agric.
- Microelectron. Reliab.
- IEEE SENSORS
- BIODEVICES
- ICTON
- IROS
- MobiCom
- IEEE Robotics Autom. Lett.
- IECON
- Device-Independent Color Imaging
- MHS
- OFC
- CHI Extended Abstracts
- IEEE Trans. Biomed. Eng.
- GHTC
- ACC
- IGARSS
- IRPS
- CHI
- ICUMT
- Future Internet
- Three-Dimensional Image Capture and Applications
- IEEE Geosci. Remote. Sens. Lett.
- J. Electron. Test.
- IEEE Consumer Electron. Mag.
- ICRA
- Microelectron. J.
- ASSETS
- IEICE Trans. Electron.
- GCCE
- CISP-BMEI
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