SCANNING DEVICES
Experts
- Dingyi Fang
- Jianyu Yang
- Xiaojiang Chen
- Yulin Huang
- Nicholas D. Lane
- Siyang Zuo
- Ju Wang
- Yuebo Zha
- Royson Lee
- Koichiro Adachi
- Takanori Suzuki
- Hongbo Jiang
- Shigehisa Tanaka
- Stylianos I. Venieris
- Jie Xiong
- Wuyuan Xie
- Thilina Dulantha Lalitharatne
- Yating Liao
- Guang-Zhong Yang
- Ryotaro Konoike
- Achim Schweikard
- Kouji Nakahara
- Michel Amberg
- John Conklin
- Hirley Alves
- Rajat Das
- R. Vinodkumar
- Yong Zhou
- Christian Sánchez
- Mark W. Patton
- Raymond Joseph Acciavatti
- John Lloyd
- Alessandro Pozzebon
- Pooran C. Joshi
- Claus Vielhauer
- Vitus Maierhöfer
- Debatri Chatterjee
- Jan Elseberg
- Daewon Lee
Venues
- Sensors
- CoRR
- IEEE Trans. Instrum. Meas.
- IEEE Access
- NEMS
- EMBC
- Remote. Sens.
- Proc. IEEE
- IEEE SENSORS
- Comput. Electron. Agric.
- Microelectron. Reliab.
- MobiCom
- IEEE Robotics Autom. Lett.
- IROS
- ICTON
- BIODEVICES
- OFC
- IECON
- IEEE Trans. Biomed. Eng.
- GHTC
- ICUMT
- ACC
- CHI Extended Abstracts
- MHS
- IGARSS
- Device-Independent Color Imaging
- Bildverarbeitung für die Medizin
- Future Internet
- CHI
- IEEE Trans. Haptics
- Adv. Intell. Syst.
- WHC
- ICPADS
- J. Electron. Test.
- Three-Dimensional Image Capture and Applications
- IEEE Geosci. Remote. Sens. Lett.
- PETRA
- CBMS
- ISI
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