Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays.

Randy W. Mann William McMahon Yoann Mamy Randriamihaja Yuncheng Song Ajay Anand Kallianpur Sheng Xie Akhilesh Gautam Joseph Versaggi Biju Parameshwaran Chad E. Weintraub

Published in: IEEE Trans. Very Large Scale Integr. Syst. (2017)

Keyphrases