Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays.
Randy W. MannWilliam McMahonYoann Mamy RandriamihajaYuncheng SongAjay Anand KallianpurSheng XieAkhilesh GautamJoseph VersaggiBiju ParameshwaranChad E. WeintraubPublished in: IEEE Trans. Very Large Scale Integr. Syst. (2017)