W. W. (Bill) Abadeer

Publication Activity (10 Years)

Years Active: 1999-2007
Publications (10 Years): 0

Publications

W. W. (Bill) Abadeer
Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides. Microelectron. Reliab. 47 (2-3) (2007)
Randy W. Mann, W. W. (Bill) Abadeer, Matthew J. Breitwisch, O. Bula, Jeff S. Brown, Bryant C. Colwill, Peter E. Cottrell, William T. Crocco Jr., Stephen S. Furkay, Michael J. Hauser, Terence B. Hook, Dennis Hoyniak, James M. Johnson, Chung Hon Lam, Rebecca D. Mih, J. Rivard, Atsushi Moriwaki, E. Phipps, Christopher S. Putnam, BethAnn Rainey, James J. Toomey, Mohammad Imran Younus
Ultralow-power SRAM technology. IBM J. Res. Dev. 47 (5-6) (2003)
W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43 (3) (1999)