Raymond P. Mallette

Publication Activity (10 Years)

Years Active: 1995-1999
Publications (10 Years): 0

Publications

W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43 (3) (1999)
Donald G. Chesebro, James W. Adkisson, Lyman R. Clark, Steven N. Eslinger, Margaret A. Faucher, Steven J. Holmes, Raymond P. Mallette, Edward J. Nowak, Edward W. Sengle, Steven H. Voldman, Thomas W. Weeks
Overview of gate linewidth control in the manufacture of CMOS logic chips. IBM J. Res. Dev. 39 (1-2) (1995)