Philip H. Noel

Publication Activity (10 Years)

Years Active: 1999-1999
Publications (10 Years): 0

Publications

W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43 (3) (1999)