Steven W. Mittl

Publication Activity (10 Years)

Years Active: 1999-2015
Publications (10 Years): 0

Top Topics

Information Systems

Reliability Assessment

Top Venues

Publications

Steven W. Mittl, Fernando Guarin
Self-heating and its implications on hot carrier reliability evaluations. IRPS (2015)
Matthew J. Breitwisch, Chung Hon Lam, Jeffrey B. Johnson, Steven W. Mittl, Jian W. Zhu
A novel CMOS compatible embedded nonvolatile memory with zero process adder. MTDT (2005)
W. W. (Bill) Abadeer, Asmik Bagramian, David W. Conkle, Charles W. Griffin, Eric Langlois, Brian F. Lloyd, Raymond P. Mallette, James E. Massucco, Jonathan M. McKenna, Steven W. Mittl, Philip H. Noel
Key measurements of ultrathin gate dielectric reliability and in-line monitoring. IBM J. Res. Dev. 43 (3) (1999)