Effect of stress voltages on voltage acceleration and lifetime projections for ultra-thin gate oxides.

W. W. (Bill) Abadeer

Published in: Microelectron. Reliab. (2007)

Keyphrases

field effect transistors
transmission line
electric field
steady state
power system
active power
reactive power
operating conditions
high speed
short circuit
power supply
silicon dioxide
three dimensional
high density
mathematical analysis
life span
x ray
low cost