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Improving SRAM Vmin and yield by using variation-aware BTI stress.
Jiajing Wang
Satyanand Nalam
Zhenyu Qi
Randy W. Mann
Mircea R. Stan
Benton H. Calhoun
Published in:
CICC (2010)
Keyphrases
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power consumption
data transmission
databases
multiresolution
real time
data mining
user interface