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Improving SRAM Vmin and yield by using variation-aware BTI stress.

Jiajing WangSatyanand NalamZhenyu QiRandy W. MannMircea R. StanBenton H. Calhoun
Published in: CICC (2010)
Keyphrases
  • power consumption
  • data transmission
  • databases
  • multiresolution
  • real time
  • data mining
  • user interface