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Understanding gate metal work function (mWF) impact on device reliability - A holistic approach.

P. SrinivasanRakesh RanjanS. CiminoA. ZainuddinB. KannanL. PantisanoI. MahmudG. DilliwayTanya Nigam
Published in: IRPS (2018)
Keyphrases
  • field effect transistors
  • steady state
  • high density
  • mathematical analysis
  • deeper understanding
  • reliability analysis
  • database
  • data sets
  • databases
  • x ray
  • failure rate
  • highly reliable
  • reliability assessment