Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs.
M. Iqbal MahmudAmit GuptaMaria Toledano-LuqueN. Rao MavillaJ. JohnsonP. SrinivasanA. ZainuddinS. RaoSalvatore CiminoByoung MinTanya NigamPublished in: IRPS (2019)