P. Srinivasan

Publication Activity (10 Years)

Years Active: 2004-2024
Publications (10 Years): 19

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Alan Y. Otero-Carrascal, Dora A. Chaparro-Ortiz, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Gonzalez, P. Srinivasan
Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique. IRPS (2024)
P. Srinivasan, Oscar H. Gonzalez, Oscar D. Restrepo, J. Lestage, Shafi Syed, W. Taylor, Anirban Bandyopadhyay, Martin Gall, S. Ludvik
Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers. IRPS (2024)
Dora A. Chaparro-Ortiz, Alan Y. Otero-Carrascal, Edmundo A. Gutiérrez-D., Reydezel Torres-Torres, Oscar Huerta-Guevara, P. Srinivasan, Fernando Guarin
Impact of Non-Conducting HCI Degradation on Small-Signal Parameters in RF SOI MOSFET. IRPS (2023)
P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS (2023)
Aarti Rathi, Abhisek Dixit, Naga Satish, P. Srinivasan, Fernando Guarin
Reliability of SPST Series-stacked SOI CMOS RF Switches for mmWave Applications. IRPS (2023)
Aarti Rathi, Abhisek Dixit, P. Srinivasan, Oscar H. Gonzalez, Fernando Guarin
RF Reliability of CMOS-Based Power Amplifier Cell for 5G mmWave Applications. IRPS (2022)
Salvatore Cimino, J. Singh, J. B. Johnson, W. Zheng, Y. Chen, W. Liu, P. Srinivasan, O. Gonzales, M. Hauser, M. Koskinen, K. Nagahiro, Y. Liu, B. Min, Tanya Nigam, N. Squib
Optimized LDMOS Offering for Power Management and RF Applications. IRPS (2022)
Ned Cahoon, P. Srinivasan, Fernando Guarin
6G Roadmap for Semiconductor Technologies: Challenges and Advances. IRPS (2022)
P. Srinivasan, Fernando Guarin, Enkhbayasgalan Gantsog, Harish Krishnaswamy, Arun Natarajan
Excellent RF Product HTOL reliability of 5G mmWave beamformer chip fabricated using GF 45RFSOI technologies. IRPS (2022)
M. Hauser, P. Srinivasan, A. Vallett, R. Krishnasamy, Fernando Guarin, Dave Brochu, V. Pham, Byoung Min
Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. IRPS (2022)
Asifa Amin, Aarti Rathi, Sujit K. Singh, Abhisek Dixit, Oscar H. Gonzalez, P. Srinivasan, Fernando Guarin
Deep Cryogenic Temperature TDDB in 45-nm PDSOI N-channel FETs for Quantum Computing Applications. IRPS (2022)
P. Srinivasan, Da Song, David Rose, Maurice LaCroix, Arunima Dasgupta
Back gate bias effect and layout dependence on Random Telegraph Noise in FDSOI technologies. IRPS (2021)
P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS (2021)
Sameer H. Jain, Dimitri Lederer, Arvind Kumar, Sudesh Saroop, Chris Prindle, P. Srinivasan, Wen Liu, Ravi Achanta, Erdem Kaltalioglu, Stephen Moss, Greg Freeman, Paul Colestock
Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI. ESSDERC (2021)
Aarti Rathi, P. Srinivasan, Fernando Guarin, Abhisek Dixit
Large Signal RF Reliability of 45-nm RFSOI Power Amplifier Cell for Wi-Fi6 Applications. IRPS (2021)
P. Srinivasan, Fernando Guarin
CMOS RF reliability for 5G mmWave applications - Challenges and Opportunities. IRPS (2021)
Paul Colestock, P. Srinivasan, Fernando Guarin
Silicon Based RF Reliability Challenges for 5G Communications. IRPS (2020)
P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS (2020)
M. Iqbal Mahmud, Amit Gupta, Maria Toledano-Luque, N. Rao Mavilla, J. Johnson, P. Srinivasan, A. Zainuddin, S. Rao, Salvatore Cimino, Byoung Min, Tanya Nigam
Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. IRPS (2019)
Dalton M. Colombo, Gilson I. Wirth, Sergio Bampi, P. Srinivasan
Voltage reference design using 1 V power supply in 0.13 µm CMOS technology. LASCAS (2013)
Gilson I. Wirth, Dragica Vasileska, N. Ashraf, Lucas Brusamarello, R. Della Giustina, P. Srinivasan
Compact modeling and simulation of Random Telegraph Noise under non-stationary conditions in the presence of random dopants. Microelectron. Reliab. 52 (12) (2012)
P. Srinivasan, Andrew Marshall
Correlating op-amp circuit noise with device flicker (1/f) noise for analog design applications. SoCC (2009)
P. Srinivasan, B. Vootukuru, Durga Misra
Screening of Hot Electron Effect During Plasma Processing. VLSI Design (2004)