Thermal Considerations on RF Reliability and Aging in SOI CMOS Based Power Amplifiers.
P. SrinivasanOscar H. GonzalezOscar D. RestrepoJ. LestageShafi SyedW. TaylorAnirban BandyopadhyayMartin GallS. LudvikPublished in: IRPS (2024)
Keyphrases
- silicon on insulator
- high power
- power consumption
- low power
- software aging
- power supply
- electrical power
- ibm power processor
- low cost
- high speed
- radio frequency
- power dissipation
- relevance feedback
- cmos technology
- power management
- power system
- infrared
- face recognition
- power distribution systems
- focal plane
- circuit design
- analog vlsi
- energy saving