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Assessing Non-Conducting Off-State Induced Hard Breakdown for PD-SOI MOSFETs using an RF Measurement Technique.

Alan Y. Otero-CarrascalDora A. Chaparro-OrtizEdmundo A. Gutiérrez-D.Reydezel Torres-TorresOscar Huerta-GonzalezP. Srinivasan
Published in: IRPS (2024)
Keyphrases
  • decision making
  • state space
  • artificial intelligence
  • information systems
  • case study
  • artificial neural networks