RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications.

P. Srinivasan J. Lestage Shafi Syed X. Hui Stephen Moss Oscar D. Restrepo Oscar H. Gonzalez Y. Chen T. McKay Anirban Bandyopadhyay Ned Cahoon Fernando Guarin Byoung Min Martin Gall S. Ludvik

Published in: IRPS (2023)

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