Stephen Moss

Publication Activity (10 Years)

Years Active: 2020-2023
Publications (10 Years): 5

Top Topics

Reliability Analysis

Top Venues

Publications

P. Srinivasan, J. Lestage, Shafi Syed, X. Hui, Stephen Moss, Oscar D. Restrepo, Oscar H. Gonzalez, Y. Chen, T. McKay, Anirban Bandyopadhyay, Ned Cahoon, Fernando Guarin, Byoung Min, Martin Gall, S. Ludvik
RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. IRPS (2023)
P. Srinivasan, Fernando Guarin, Shafi Syed, Joris Angelo Sundaram Jerome, Wen Liu, Sameer H. Jain, Dimitri Lederer, Stephen Moss, Paul Colestock, Anirban Bandyopadhyay, Ned Cahoon, Byoung Min, Martin Gall
RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. IRPS (2021)
Sameer H. Jain, Dimitri Lederer, Arvind Kumar, Sudesh Saroop, Chris Prindle, P. Srinivasan, Wen Liu, Ravi Achanta, Erdem Kaltalioglu, Stephen Moss, Greg Freeman, Paul Colestock
Novel mmWave NMOS Device for High Pout mmWave Power Amplifiers in 45RFSOI. ESSDERC (2021)
Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome
Passive Intermodulation (PIM) Test and Measurement. NATW (2020)
P. Srinivasan, Paul Colestock, Thomas Samuels, Stephen Moss, Fernando Guarin, Byoung Min
A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. IRPS (2020)