RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications.

P. Srinivasan Fernando Guarin Shafi Syed Joris Angelo Sundaram Jerome Wen Liu Sameer H. Jain Dimitri Lederer Stephen Moss Paul Colestock Anirban Bandyopadhyay Ned Cahoon Byoung Min Martin Gall

Published in: IRPS (2021)

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