RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications.
P. SrinivasanFernando GuarinShafi SyedJoris Angelo Sundaram JeromeWen LiuSameer H. JainDimitri LedererStephen MossPaul ColestockAnirban BandyopadhyayNed CahoonByoung MinMartin GallPublished in: IRPS (2021)