NATW

Keyphrases

Publications

2020

Joshua Immanuel, Spencer K. Millican
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. NATW (2020)
Stephen Moss, Elanchezhian Veeramani, Joris Angelo Sundaram Jerome
Passive Intermodulation (PIM) Test and Measurement. NATW (2020)
29th IEEE North Atlantic Test Workshop, NATW 2020, Albany, NY, USA, June 17-24, 2020 NATW (2020)
Marcia Golmohamadi, Ryan Jurasek, Wolfgang Hokenmaier, Donald Labrecque, Ruoyu Zhi, Bret Dale, Nibir Islam, Dave Kinney, Angela Johnson
Verification and Testing Considerations of an In-Memory AI Chip. NATW (2020)
Konstantinos Poulos, Themistoklis Haniotakis
A Built In Test circuit for waveform classification at high frequencies. NATW (2020)
Stewart Rauch, Dongho Lee, Alexey Vert, Roy Gupta
Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics. NATW (2020)
Peter C. Paliwoda, Maria Toledano-Luque, Tanya Nigam, F. Guarin, M. Nour, S. Cimino, L. Pantisano, A. Gupta, O. H. Gonzalez, M. Hauser, W. Liu, A. Vayshenker, D. Ioannou, D. Lee, L. Jiang, P. Yee, Stewart Rauch, B. Min
Self-heating characterization and its applications in technology development. NATW (2020)
Naznin Akter, Mustafa Karabiyik, Michael S. Shur, John Suarez, Nezih Pala
AI Powered THz VLSI Testing Technology. NATW (2020)

2019

2018

2017

2016

2015