Spencer K. Millican

Publication Activity (10 Years)

Years Active: 2012-2024
Publications (10 Years): 15

Top Topics

Special Session

Integrated Circuit

Top Venues

J. Electron. Test.

Publications

Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
A Survey and Recent Advances: Machine Intelligence in Electronic Testing. J. Electron. Test. 40 (2) (2024)
Yang Sun, Spencer K. Millican
Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion. J. Electron. Test. 38 (4) (2022)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Special Session - Machine Learning in Test: A Survey of Analog, Digital, Memory, and RF Integrated Circuits. VTS (2021)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Unsupervised Learning in Test Generation for Digital Integrated Circuits. ETS (2021)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Training Neural Network for Machine Intelligence in Automatic Test Pattern Generator. VLSI Design (2021)
Soham Roy, Spencer K. Millican, Vishwani D. Agrawal
Machine Intelligence for Efficient Test Pattern Generation. ITC (2020)
Yang Sun, Spencer K. Millican, Vishwani D. Agrawal
Special Session: Survey of Test Point Insertion for Logic Built-in Self-test. VTS (2020)
Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal
Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures. J. Electron. Test. 36 (1) (2020)
Joshua Immanuel, Spencer K. Millican
Calculating Signal Controllability using Neural Networks: Improvements to Testability Analysis and Test Point Insertion. NATW (2020)
Yang Sun, Spencer K. Millican
Test Point Insertion Using Artificial Neural Networks. ISVLSI (2019)
Sankaran M. Menon, Ashish Gupta, Chinna Prudvi, Rolf Kühnis, Sukhbinder Singh Takhar, Spencer K. Millican, Eric Rentschler, Pandy Kalimuthu, Preeti Ranjan Panda, Priyadarsan Patra
Techniques for Debug of Low Power SoCs. MTV (2019)
Jubayer Mahmod, Spencer K. Millican, Ujjwal Guin, Vishwani D. Agrawal
Special Session: Delay Fault Testing - Present and Future. VTS (2019)
Soham Roy, Brandon Stiene, Spencer K. Millican, Vishwani D. Agrawal
Improved Random Pattern Delay Fault Coverage Using Inversion Test Points. NATW (2019)
Spencer K. Millican, Yang Sun, Soham Roy, Vishwani D. Agrawal
Applying Neural Networks to Delay Fault Testing: Test Point Insertion and Random Circuit Training. ATS (2019)
Spencer K. Millican, Kewal K. Saluja
Optimal Test Scheduling of Stacked Circuits under Various Hardware and Power Constraints. VLSI Design (2015)
Spencer K. Millican, Parameswaran Ramanathan, Kewal K. Saluja
CryptIP: An Approach for Encrypting Intellectual Property Cores with Simulation Capabilities. VLSI Design (2014)
Spencer K. Millican, Kewal K. Saluja
A Test Partitioning Technique for Scheduling Tests for Thermally Constrained 3D Integrated Circuits. VLSI Design (2014)
Spencer K. Millican, Kewal K. Saluja
Optimal Test Scheduling Formulation under Power Constraints with Dynamic Voltage and Frequency Scaling. J. Electron. Test. 30 (5) (2014)
Spencer K. Millican, Kewal K. Saluja
Formulating Optimal Test Scheduling Problem with Dynamic Voltage and Frequency Scaling. Asian Test Symposium (2013)
Spencer K. Millican, Kewal K. Saluja
Linear Programming Formulations for Thermal-Aware Test Scheduling of 3D-Stacked Integrated Circuits. Asian Test Symposium (2012)