Improved Random Pattern Delay Fault Coverage Using Inversion Test Points.

Soham Roy Brandon Stiene Spencer K. Millican Vishwani D. Agrawal

Published in: NATW (2019)

Keyphrases

point sets
randomly distributed
feature points
case study
three dimensional
sample points
test cases
test data
pattern detection
sampled data
single point
statistical significance
improved algorithm
genetic algorithm
markov chain
website
information systems
learning algorithm