Linear Programming Formulations for Thermal-Aware Test Scheduling of 3D-Stacked Integrated Circuits.
Spencer K. MillicanKewal K. SalujaPublished in: Asian Test Symposium (2012)
Keyphrases
- integrated circuit
- linear programming
- built in self test
- linear program
- scheduling problem
- electron beam
- dynamic programming
- scheduling algorithm
- constraint propagation
- infrared
- lagrangian relaxation
- valid inequalities
- nonlinear programming
- test data
- feasible solution
- objective function
- quadratic programming
- printed circuit boards
- response time
- flexible manufacturing systems
- np hard