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Applying Artificial Neural Networks to Logic Built-in Self-test: Improving Test Point Insertion.

Yang SunSpencer K. Millican
Published in: J. Electron. Test. (2022)
Keyphrases
  • built in self test
  • artificial neural networks
  • integrated circuit
  • computational intelligence
  • using artificial neural networks
  • neural network
  • back propagation
  • soft computing
  • real time
  • data sets
  • logic programs