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Improved Pseudo-Random Fault Coverage Through Inversions: a Study on Test Point Architectures.

Soham RoyBrandon StieneSpencer K. MillicanVishwani D. Agrawal
Published in: J. Electron. Test. (2020)
Keyphrases
  • experimental design
  • pseudorandom
  • e learning
  • statistical analysis
  • real time
  • learning algorithm
  • empirical studies