Sankaran M. Menon

Publication Activity (10 Years)

Years Active: 1991-2022
Publications (10 Years): 2

Top Topics

Delay Insensitive

Special Session

Top Venues

Publications

Sankaran M. Menon, Rolf Kühnis
Special Session: Closed Chassis Platform Debug of Compute Systems using the Functional Ubiquitous USB Type-C Receptacle. VTS (2022)
Sankaran M. Menon, Ashish Gupta, Chinna Prudvi, Rolf Kühnis, Sukhbinder Singh Takhar, Spencer K. Millican, Eric Rentschler, Pandy Kalimuthu, Preeti Ranjan Panda, Priyadarsan Patra
Techniques for Debug of Low Power SoCs. MTV (2019)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Testing in BiCMOS and CMOS Circuits. VLSI Design (1997)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design 5 (3) (1997)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design 4 (3) (1996)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI (1996)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30 (8) (1995)
Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon
A Novel High-Speed BiCMOS Domino Logic Family. ISCAS (1995)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design (1994)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Input pattern classification for transistor level testing of BiCMOS circuits. VTS (1994)
Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon
Testing for Large ICs. VLSI Design 1 (4) (1994)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Testable design for BiCMOS stuck-open fault detection. VTS (1993)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Test Generation for BiCMOS Circuits. ISCAS (1993)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
On Bridging Faults in ECL Circuits. VLSI Design (1992)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Behavior of faulty single BJT BiCMOS logic gates. VTS (1992)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Gate level representation of ECL circuits for fault modeling. Great Lakes Symposium on VLSI (1991)
Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon
Enhancement of resolution in supply current based testing for large ICs. VTS (1991)