On Bridging Faults in ECL Circuits.
Sankaran M. MenonAnura P. JayasumanaYashwant K. MalaiyaPublished in: VLSI Design (1992)
Keyphrases
- built in self test
- fault models
- fault diagnosis
- model based diagnosis
- analog circuits
- fault detection and diagnosis
- fault detection
- high speed
- multiple faults
- fault model
- tunnel diode
- circuit design
- expert systems
- logic synthesis
- delay insensitive
- test cases
- logic circuits
- digital circuits
- integrated circuit
- digital divide
- quantum computing
- dynamic systems
- source code
- floating gate
- information technology
- database