Yashwant K. Malaiya

Publication Activity (10 Years)

Years Active: 1978-2023
Publications (10 Years): 9

Top Topics

Disaster Recovery

Top Venues

Softw. Qual. J.

Int. J. Inf. Sec.

Publications

Robin J. Yeman, Yashwant K. Malaiya
Comparison of Agile Scaling Frameworks. ICISS (2023)
Jim A. Scheibmeir, Yashwant K. Malaiya
Social media analytics of the Internet of Things. Discov. Internet Things 1 (1) (2021)
Peng Xiao, Yongfeng Yin, Bin Liu, Bo Jiang, Yashwant K. Malaiya
Adaptive Testing Based on Moment Estimation. IEEE Trans. Syst. Man Cybern. Syst. 50 (3) (2020)
Jim A. Scheibmeir, Yashwant K. Malaiya
Quality Model for Testing Augmented Reality Applications. UEMCON (2019)
Jim A. Scheibmeir, Yashwant K. Malaiya
An API Development Model for Digital Twins. QRS Companion (2019)
HyunChul Joh, Yashwant K. Malaiya
Periodicity in software vulnerability discovery, patching and exploitation. Int. J. Inf. Sec. 16 (6) (2017)
Awad A. Younis, Yashwant K. Malaiya, Charles Anderson, Indrajit Ray
To Fear or Not to Fear That is the Question: Code Characteristics of a Vulnerable Functionwith an Existing Exploit. CODASPY (2016)
Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
Evaluating CVSS Base Score Using Vulnerability Rewards Programs. SEC (2016)
Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
Assessing vulnerability exploitability risk using software properties. Softw. Qual. J. 24 (1) (2016)
Awad A. Younis, Yashwant K. Malaiya
Comparing and Evaluating CVSS Base Metrics and Microsoft Rating System. QRS (2015)
HyunChul Joh, Yashwant K. Malaiya
Modeling Skewness in Vulnerability Discovery. Qual. Reliab. Eng. Int. 30 (8) (2014)
Awad A. Younis, Yashwant K. Malaiya
Using Software Structure to Predict Vulnerability Exploitation Potential. SERE (Companion) (2014)
Omar Hussain Alhazmi, Yashwant K. Malaiya
Are the Classical Disaster Recovery Tiers Still Applicable Today? ISSRE Workshops (2014)
Awad A. Younis, Yashwant K. Malaiya, Indrajit Ray
Using Attack Surface Entry Points and Reachability Analysis to Assess the Risk of Software Vulnerability Exploitability. HASE (2014)
Omar Hussain Alhazmi, Yashwant K. Malaiya
Assessing Disaster Recovery Alternatives: On-Site, Colocation or Cloud. ISSRE Workshops (2012)
Sung-Whan Woo, HyunChul Joh, Omar Hussain Alhazmi, Yashwant K. Malaiya
Modeling vulnerability discovery process in Apache and IIS HTTP servers. Comput. Secur. 30 (1) (2011)
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC (2010)
HyunChul Joh, Yashwant K. Malaiya
Seasonal Variation in the Vulnerability Discovery Process. ICST (2009)
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
An outlier detection based approach for PCB testing. ITC (2009)
Shen Hui Wu, Sridhar Jandhyala, Yashwant K. Malaiya, Anura P. Jayasumana
Antirandom Testing: A Distance-Based Approach. VLSI Design 2008 (2008)
HyunChul Joh, Jinyoo Kim, Yashwant K. Malaiya
Vulnerability Discovery Modeling Using Weibull Distribution. ISSRE (2008)
HyunChul Joh, Yashwant K. Malaiya
Seasonality in Vulnerability Discovery in Major Software Systems. ISSRE (2008)
Omar Hussain Alhazmi, Yashwant K. Malaiya
Application of Vulnerability Discovery Models to Major Operating Systems. IEEE Trans. Reliab. 57 (1) (2008)
Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray
Measuring, analyzing and predicting security vulnerabilities in software systems. Comput. Secur. 26 (3) (2007)
Jinyoo Kim, Yashwant K. Malaiya, Indrakshi Ray
Vulnerability Discovery in Multi-Version Software Systems. HASE (2007)
Ashutosh Sharma, Anura P. Jayasumana, Yashwant K. Malaiya
X-IDDQ: A Novel Defect Detection Technique Using IDDQ Data. VTS (2006)
Sung-Whan Woo, Omar Hussain Alhazmi, Yashwant K. Malaiya
Assessing Vulnerabilities in Apache and IIS HTTP Servers. DASC (2006)
Omar Hussain Alhazmi, Sung-Whan Woo, Yashwant K. Malaiya
Security vulnerability categories in major software systems. Communication, Network, and Information Security (2006)
Omar Hussain Alhazmi, Yashwant K. Malaiya
Measuring and Enhancing Prediction Capabilities of Vulnerability Discovery Models for Apache and IIS HTTP Servers. ISSRE (2006)
Omar Hussain Alhazmi, Yashwant K. Malaiya
Modeling the Vulnerability Discovery Process. ISSRE (2005)
Artem Sokolov, Alodeep Sanyal, L. Darrell Whitley, Yashwant K. Malaiya
Dynamic power minimization during combinational circuit testing as a traveling salesman problem. Congress on Evolutionary Computation (2005)
Omar Hussain Alhazmi, Yashwant K. Malaiya, Indrajit Ray
Security Vulnerabilities in Software Systems: A Quantitative Perspective. DBSec (2005)
Jiao Chen, Yashwant K. Malaiya
Augmenting Test Case Generation Using Statechart. Software Engineering Research and Practice (2004)
Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich
Software reliability growth with test coverage. IEEE Trans. Reliab. 51 (4) (2002)
Yashwant K. Malaiya, Jason Denton
Module Size Distribution and Defect Density. ISSRE (2000)
Yashwant K. Malaiya, Jason Denton
Requirements volatility and defect density. ISSRE (1999)
Shen Hui Wu, Yashwant K. Malaiya, Anura P. Jayasumana
Antirandom vs. pseudorandom testing. ICCD (1998)
Yashwant K. Malaiya, Jason Denton
Estimating the Number of Residual Defects. HASE (1998)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Testing in BiCMOS and CMOS Circuits. VLSI Design (1997)
Huifang Yin, Zemen Lebne-Dengel, Yashwant K. Malaiya
Automatic test generation using checkpoint encoding and antirandom testing. ISSRE (1997)
Yashwant K. Malaiya, Jason Denton
What do the software reliability growth model parameters represent? ISSRE (1997)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
Operational and Test Performance in the Presence of Built-in Current Sensors. VLSI Design 5 (3) (1997)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Fault Modeling of ECL for High Fault Coverage of Physical Defects. VLSI Design 4 (3) (1996)
Michael Naixin Li, Yashwant K. Malaiya
Fault exposure ratio estimation and applications. ISSRE (1996)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits. Great Lakes Symposium on VLSI (1996)
Yashwant K. Malaiya
Antirandom testing: getting the most out of black-box testing. ISSRE (1995)
Michael Naixin Li, Yashwant K. Malaiya
ROBUST: a next generation software reliability engineering tool. ISSRE (1995)
Ramanagopal V. Vogety, Yashwant K. Malaiya, Anura P. Jayasumana
Interconnection of FDDI-II networks through an ATM backbone - An analysis. LCN (1995)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Rochit Rajsuman
Testable design of BiCMOS circuits for stuck-open fault detection using single patterns. IEEE J. Solid State Circuits 30 (8) (1995)
Anura P. Jayasumana, Yashwant K. Malaiya, Sankaran M. Menon
A Novel High-Speed BiCMOS Domino Logic Family. ISCAS (1995)
Michael Naixin Li, Yashwant K. Malaiya
On input profile selection for software testing. ISSRE (1994)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong
The Effect of Built-In Current Sensors (BICS) on Operational and Test Performance. VLSI Design (1994)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Input pattern classification for transistor level testing of BiCMOS circuits. VTS (1994)
Yashwant K. Malaiya, Michael Naixin Li, James M. Bieman, Rick Karcich, Bob Skibbe
The relationship between test coverage and reliability. ISSRE (1994)
Yashwant K. Malaiya, Anura P. Jayasumana, Carol Q. Tong, Sankaran M. Menon
Testing for Large ICs. VLSI Design 1 (4) (1994)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Testable design for BiCMOS stuck-open fault detection. VTS (1993)
Kang Wu, Yashwant K. Malaiya
The effect of correlated faults on software reliability. ISSRE (1993)
Michael Naixin Li, Yashwant K. Malaiya
Enhancing accuracy of software reliability prediction. ISSRE (1993)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Test Generation for BiCMOS Circuits. ISCAS (1993)
W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana
Faulty behavior of storage elements and its effects on sequential circuits. IEEE Trans. Very Large Scale Integr. Syst. 1 (4) (1993)
W. K. Al-Assadi, Yashwant K. Malaiya, Anura P. Jayasumana
Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits. VLSI Design (1993)
Anneliese von Mayrhauser, Yashwant K. Malaiya, Pradip K. Srimani, James Keables
On the need for simulation for better characterization of software reliability. ISSRE (1993)
Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani
An Examination of Fault Exposure Ratio. IEEE Trans. Software Eng. 19 (11) (1993)
Yashwant K. Malaiya, Anneliese von Mayrhauser, Pradip K. Srimani
The nature of fault exposure ratio. ISSRE (1992)
Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya
Using Neural Networks in Reliability Prediction. IEEE Softw. 9 (4) (1992)
Yashwant K. Malaiya
Guest Editor's Introduction: VLSI Design 92. IEEE Des. Test Comput. 9 (4) (1992)
Nachimuthu Karunanithi, Yashwant K. Malaiya
The scaling problem in neural networks for software reliability prediction. ISSRE (1992)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
On Bridging Faults in ECL Circuits. VLSI Design (1992)
Sankaran M. Menon, Yashwant K. Malaiya, Anura P. Jayasumana
Behavior of faulty single BJT BiCMOS logic gates. VTS (1992)
Pradip K. Srimani, Yashwant K. Malaiya
Steps to Practical Reliability Meassurement - Guest Editors' Introduction. IEEE Softw. 9 (4) (1992)
Nachimuthu Karunanithi, L. Darrell Whitley, Yashwant K. Malaiya
Prediction of Software Reliability Using Connectionist Models. IEEE Trans. Software Eng. 18 (7) (1992)
Nachimuthu Karunanithi, Yashwant K. Malaiya, L. Darrell Whitley
Prediction of software reliability using neural networks. ISSRE (1991)
Yinghua Min, Yashwant K. Malaiya, Boping Jin
Analysis of Detection Capability of Parallel Signature Analyzers. IEEE Trans. Computers 40 (9) (1991)
Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya, Juney Park
An analysis and testing of operation induced faults in MOS VLSI. VTS (1991)
Sankaran M. Menon, Anura P. Jayasumana, Yashwant K. Malaiya
Gate level representation of ECL circuits for fault modeling. Great Lakes Symposium on VLSI (1991)
Yashwant K. Malaiya, Pradip K. Srimani
An Introduction to Software Reliability Models. Int. CMG Conference (1991)
Yashwant K. Malaiya, Anura P. Jayasumana, Qiao Tong, Sankaran M. Menon
Enhancement of resolution in supply current based testing for large ICs. VTS (1991)
Sheng Feng, Yashwant K. Malaiya
Evaluation of detectability in BIST environment. VTS (1991)
Yashwant K. Malaiya, Nachimuthu Karunanithi, Pradeep Verma
Predictability measures for software reliability models. COMPSAC (1990)
S. Hwang, Rochit Rajsuman, Yashwant K. Malaiya
On the testing of microprogrammed processor. MICRO (1990)
Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
Limitations of switch level analysis for bridging faults. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 8 (7) (1989)
Rochit Rajsuman, Anura P. Jayasumana, Yashwant K. Malaiya
CMOS Stuck-open Fault Detection Using Single Test Patterns. DAC (1989)
Yashwant K. Malaiya
On inherent untestability of unaugmented microprogrammed control. MICRO (1989)
Yashwant K. Malaiya, S. Feng
Design of a testable RISC-to-CISC control architecture. MICRO (1988)
Rochit Rajsuman, Yashwant K. Malaiya, Anura P. Jayasumana
On Accuracy of Switch-Level Modeling of Bridging Faults in Complex Gates. DAC (1987)
Yashwant K. Malaiya
Faults in Microprogrammed and Hardwired Control. ITC (1985)
Yashwant K. Malaiya, Ramesh Narayanaswamy
Modeling and Testing for Timing Faults in Synchronous Sequential Circuits. IEEE Des. Test 1 (4) (1984)
Yashwant K. Malaiya, Shoubao Yang
The Coverage Problem for Random Testing. ITC (1984)
Yashwant K. Malaiya, Ramesh Narayanaswamy
Testing for Timing Faults in Synchronous Sequential Integrated Circuits. ITC (1983)
Yashwant K. Malaiya, Stephen Y. H. Su
A New Fault Model and Testing Technique for CMOS Devices. ITC (1982)
Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya
State Diagram Approach for Functional Testing of Control Section. ITC (1981)
Chi-Chang Liaw, Stephen Y. H. Su, Yashwant K. Malaiya
Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits. IEEE Trans. Computers 30 (12) (1981)
Yashwant K. Malaiya, Stephen Y. H. Su
Reliability Measure of Hardware Redundancy Fault-Tolerant Digital Systems with Intermittent Faults. IEEE Trans. Computers 30 (8) (1981)
Yashwant K. Malaiya, Stephen Y. H. Su
A survey of methods for intermittent fault analysis. MARK (1979)
Stephen Y. H. Su, Israel Koren, Yashwant K. Malaiya
A Continous-Parameter Markov Model and Detection Procedures for Intermittent Faults. IEEE Trans. Computers 27 (6) (1978)