Test Generation for BiCMOS Circuits.

Sankaran M. Menon Anura P. Jayasumana Yashwant K. Malaiya

Published in: ISCAS (1993)

Keyphrases

test generation
test cases
symbolic execution
mixed signal
design automation
test sequences
static analysis
high speed
quality assurance
mutation testing
circuit design
multi channel
low power
software testing
test data generation
digital circuits
regression testing
computer vision
life cycle
design process