Software reliability growth with test coverage.

Yashwant K. Malaiya Michael Naixin Li James M. Bieman Rick Karcich

Published in: IEEE Trans. Reliab. (2002)

Keyphrases

software reliability
software testing
test suite
test cases
software development
multiple linear regression
software systems
wavelet neural network
neural network
machine learning
relational databases
artificial neural networks
support vector machine
open source