Kenneth P. Parker

Publication Activity (10 Years)

Years Active: 1975-2012
Publications (10 Years): 0

Top Topics

Complex Systems

Intelligent Environments

Sensing Devices

Top Venues

Publications

Kenneth P. Parker
Capacitive sensing testability in complex memory devices. ITC (2012)
Kenneth P. Parker, Shuichi Kameyama, David Dubberke
Surviving state disruptions caused by test: A case study. ITC (2011)
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
Principal Component Analysis-based compensation for measurement errors due to mechanical misalignments in PCB testing. ITC (2010)
Kenneth P. Parker
Surviving state disruptions caused by test: The "Lobotomy Problem". ITC (2010)
C. J. Clark, Dave Dubberke, Kenneth P. Parker, Bill Tuthill
Solutions for undetected shorts on IEEE 1149.1 self-monitoring pins. ITC (2010)
Xin He, Yashwant K. Malaiya, Anura P. Jayasumana, Kenneth P. Parker, Stephen Hird
An outlier detection based approach for PCB testing. ITC (2009)
Kenneth P. Parker, Jeff Burgess
What is IEEE P1149.8.1 and why? ITC (2009)
Steve Sunter, Kenneth P. Parker
Testing bridges to nowhere - combining Boundary Scan and capacitive sensing. ITC (2009)
Dayton Norrgard, Kenneth P. Parker
Augmenting Boundary-Scan Tests for Enhanced Defect Coverage. ITC (2008)
Kenneth P. Parker, Neil G. Jacobson
Boundary-Scan Testing of Power/Ground Pins. ITC (2008)
Kenneth P. Parker, Stephen Hird
Finding power/ground defects on connectors - a new approach. ITC (2007)
Kenneth P. Parker, Don DeMille
A bead probe CAD strategy for in-circuit test. ITC (2007)
Kenneth P. Parker
A new probing technique for high-speed/high-density printed circuit boards. ITC (2005)
Kenneth P. Parker
Bead probes in practice. ITC (2005)
Kenneth P. Parker
The effects of defects on high-speed boards. ITC (2005)
Kenneth P. Parker
A New Probing Technique for High-Speed/High-Density Printed Circuit Boards. ITC (2004)
Kenneth P. Parker
Board Test Coverage Needs to be Standardized. ITC (2004)
Kenneth P. Parker
Testing for what? IEEE Des. Test Comput. 20 (2) (2003)
Kenneth P. Parker
Defect Coverage of Boundary-Scan Tests: What does it mean when a Boundary-Scan test passes? ITC (2003)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE 1149.6: A Boundary-Scan Standard for Advanced Digital Networks. IEEE Des. Test Comput. 20 (5) (2003)
Kathy Hird, Kenneth P. Parker, Bill Follis
Test Coverage: What Does It Mean When a Board Test Passes?. ITC (2002)
Bill Eklow, Carl Barnhart, Kenneth P. Parker
IEEE P1149.6: A Boundary-Scan Standard for Advanced Digital Networks. ITC (2002)
Kenneth P. Parker
Board Test Is NOT Mature. ITC (2002)
Young Kim, Benny Lai, Kenneth P. Parker, Jeff Rearick
Frequency detection-based boundary-scan testing of AC coupled nets. ITC (2001)
Kenneth P. Parker
System issues in boundary-scan board test. ITC (2000)
Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC (1997)
Kenneth P. Parker
Introduction ITC 1996 Lecture Series on Unpowered Opens Testing. ITC (1996)
Mick Tegethoff, Kenneth P. Parker, Ken Lee
Opens Board Test Coverage: When is 99% Really 40%? ITC (1996)
Kenneth P. Parker, David Greene
The ITC Lecture Series: An Experiment. ITC (1995)
Mick Tegethoff, Kenneth P. Parker
IEEE Std 1149.1: Where Are We? Where From Here? IEEE Des. Test Comput. 12 (2) (1995)
Kenneth P. Parker
Observations on the 1149.x Family of Standards. ITC (1994)
Kenneth P. Parker, John E. McDermid, Stig Oresjo
Structure and Metrology for an Analog Testability Bus. ITC (1993)
Kenneth P. Parker, Stig Oresjo
A language for describing boundary scan devices. J. Electron. Test. 2 (1) (1991)
Kenneth P. Parker, Stig Oresjo
A language for describing boundary-scan devices. ITC (1990)
Kenneth P. Parker
The impact of boundary scan on board test. IEEE Des. Test 6 (4) (1989)
Kenneth P. Parker
Testability: Barriers to Acceptance. IEEE Des. Test 3 (5) (1986)
Thomas W. Williams, Kenneth P. Parker
Design for Testability - A Survey. IEEE Trans. Computers 31 (1) (1982)
Thomas W. Williams, Kenneth P. Parker
Testing Logic Networks and Designing for Testability. Computer 12 (10) (1979)
Edward J. McCluskey, Kenneth P. Parker, John J. Shedletsky
Boolean Network Probabilities and Network Design. IEEE Trans. Computers 27 (2) (1978)
Kenneth P. Parker, Edward J. McCluskey
Sequential Circuit Output Probabilities From Regular Expressions. IEEE Trans. Computers 27 (3) (1978)
Kenneth P. Parker, Edward J. McCluskey
Analysis of Logic Circuits with Faults Using Input Signal Probabilities. IEEE Trans. Computers 24 (5) (1975)
Kenneth P. Parker, Edward J. McCluskey
Probabilistic Treatment of General Combinational Networks. IEEE Trans. Computers 24 (6) (1975)