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Design, Fabrications and Use of Mixed-Signal IC Testability Structures.

Kenneth P. ParkerJohn E. McDermidRodney A. BrowenKozo NuriyaKatsuhiro HirayamaAkira Matsuzawa
Published in: ITC (1997)
Keyphrases
  • mixed signal
  • low power
  • real time
  • high speed
  • circuit design
  • single chip