John E. McDermid

Publication Activity (10 Years)

Years Active: 1993-1997
Publications (10 Years): 0

Publications

Kenneth P. Parker, John E. McDermid, Rodney A. Browen, Kozo Nuriya, Katsuhiro Hirayama, Akira Matsuzawa
Design, Fabrications and Use of Mixed-Signal IC Testability Structures. ITC (1997)
Kenneth P. Parker, John E. McDermid, Stig Oresjo
Structure and Metrology for an Analog Testability Bus. ITC (1993)