Neil G. Jacobson

Publication Activity (10 Years)

Years Active: 2000-2020
Publications (10 Years): 1

Top Topics

Processing Capabilities

Situational Awareness

Top Venues

IEEE Instrum. Meas. Mag.

Publications

Louis Y. Ungar, Neil G. Jacobson, T. M. Mak
High-speed I/O capabilities added to military automatic test equipment (ATE) using synthetic instruments. IEEE Instrum. Meas. Mag. 23 (5) (2020)
Kenneth P. Parker, Neil G. Jacobson
Boundary-Scan Testing of Power/Ground Pins. ITC (2008)
Stephen K. Sunter, Adam Osseiran, Adam Cron, Neil G. Jacobson, Dave Bonnett, Bill Eklow, Carl Barnhart, Ben Bennetts
Status of IEEE Testability Standards 1149.4, 1532 and 1149.6. DATE (2004)
Neil G. Jacobson
Streamlining programmable device and system test using IEEE Std 1532. ITC (2000)