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Testable design of BiCMOS circuits for stuck-open fault detection using single patterns.
Sankaran M. Menon
Yashwant K. Malaiya
Anura P. Jayasumana
Rochit Rajsuman
Published in:
IEEE J. Solid State Circuits (1995)
Keyphrases
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fault detection
circuit design
industrial processes
design patterns
high level synthesis
fault diagnosis
failure detection
high speed
chip design
fault identification
fault localization
robust fault detection
tennessee eastman
fault detection and isolation
neural network
np complete
expert systems