CMOS Stuck-open Fault Detection Using Single Test Patterns.
Rochit RajsumanAnura P. JayasumanaYashwant K. MalaiyaPublished in: DAC (1989)
Keyphrases
- fault detection
- industrial processes
- fault diagnosis
- fault detection and diagnosis
- failure detection
- condition monitoring
- fuel cell
- rotating machinery
- fault identification
- high speed
- tennessee eastman
- low cost
- robust fault detection
- fault isolation
- fault localization
- power consumption
- low power
- test cases
- data mining techniques
- expert systems
- search algorithm
- machine learning
- power supply
- gas turbine
- software development
- artificial intelligence
- real time