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Gate level representation of ECL circuits for fault modeling.

Sankaran M. MenonAnura P. JayasumanaYashwant K. Malaiya
Published in: Great Lakes Symposium on VLSI (1991)
Keyphrases
  • modeling tool
  • higher level
  • image representation
  • fault diagnosis
  • levels of abstraction
  • model construction
  • dynamic bayesian networks
  • cmos technology
  • geometric modeling
  • real time embedded systems