Test-Experiments for Detection and Location of Intermittent Faults in Sequential Circuits.
Chi-Chang LiawStephen Y. H. SuYashwant K. MalaiyaPublished in: IEEE Trans. Computers (1981)
Keyphrases
- built in self test
- test cases
- model based diagnosis
- detection algorithm
- false alarms
- detection rate
- automatic detection
- integrated circuit
- detection method
- object detection
- detection accuracy
- detection scheme
- change detection
- event detection
- test data
- real time
- false positives
- location information
- low cost
- fault detection
- digital circuits
- mutation testing