Input Pattern Classification for Transistor Level Testing of Bridging Faults in BiCMOS Circuits.
Sankaran M. MenonAnura P. JayasumanaYashwant K. MalaiyaPublished in: Great Lakes Symposium on VLSI (1996)
Keyphrases
- pattern classification
- high speed
- pattern recognition
- feature extraction
- test cases
- nearest neighbor rule
- radial basis function neural network
- vowel recognition
- mass spectrometry data
- fuzzy classifier
- circuit design
- probabilistic neural network
- fault diagnosis
- fault model
- decision boundary
- power dissipation
- linear dimensionality reduction
- discriminant embedding
- parzen window
- pattern classification problems
- floating gate
- nearest neighbor
- knn