PATTERN CLASSIFICATION
Experts
- Witold Pedrycz
- Vince D. Calhoun
- Seong-Whan Lee
- Mengjie Zhang
- David Zhang
- Wing W. Y. Ng
- Daoqiang Zhang
- Sung-Kwun Oh
- Björn W. Schuller
- Philip S. Yu
- Dinggang Shen
- B. John Oommen
- Sigeru Omatu
- John H. L. Hansen
- Viktor K. Prasanna
- Sankar K. Pal
- Masaaki Harada
- Francisco Herrera
- Hisao Ishibuchi
- Hemant A. Patil
- De-Shuang Huang
- Chee Peng Lim
- Yuan Yan Tang
- King-Sun Fu
- Yang Li
- Cuntai Guan
- Jing Wang
- Christos Davatzikos
- João P. Papa
- Lei Zhang
- Cheng-Lin Liu
- Fadi Dornaika
- Hui Wang
- Biao Jie
- Robert P. W. Duin
- Charu C. Aggarwal
- Chulhee Lee
- Yang Liu
- Anthony J. H. Simons
Venues
- CoRR
- NeuroImage
- IEEE Access
- Sensors
- EMBC
- ICASSP
- Pattern Recognit.
- Expert Syst. Appl.
- IJCNN
- Neurocomputing
- Pattern Recognit. Lett.
- INTERSPEECH
- Neural Comput. Appl.
- Biomed. Signal Process. Control.
- IGARSS
- Remote. Sens.
- Multim. Tools Appl.
- SMC
- ICPR
- Bioinform.
- EUSIPCO
- SIU
- Appl. Soft Comput.
- IEEE Trans. Geosci. Remote. Sens.
- Inf. Sci.
- Comput. Biol. Medicine
- J. Intell. Fuzzy Syst.
- ISBI
- AAAI
- BMC Bioinform.
- EGC
- IEEE Trans. Instrum. Meas.
- ICIP
- Soft Comput.
- IEEE Trans. Pattern Anal. Mach. Intell.
- IEEE Trans. Biomed. Eng.
- Knowl. Based Syst.
- CVPR
- BIBM
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