Fault Modeling of ECL for High Fault Coverage of Physical Defects.

Sankaran M. Menon Yashwant K. Malaiya Anura P. Jayasumana

Published in: VLSI Design (1996)

Keyphrases

fault diagnosis
wide range
image processing
high precision
high efficiency
fault detection
physical models
neural network
computer vision
mobile devices
wavelet transform
modeling method
physical processes