Use of Storage Elements as Primitives for Modelling Faults in Synchronous Sequential Circuits.
W. K. Al-AssadiYashwant K. MalaiyaAnura P. JayasumanaPublished in: VLSI Design (1993)
Keyphrases
- fault detection
- fault diagnosis
- high level
- built in self test
- fault models
- database
- data storage
- databases
- high speed
- storage and retrieval
- start and end points
- analog circuits
- sequential data
- storage requirements
- object model
- knowledge base
- case study
- circuit design
- power dissipation
- low level
- fault detection and diagnosis
- genetic algorithm
- test cases
- xml data