Testing for Timing Faults in Synchronous Sequential Integrated Circuits.

Yashwant K. Malaiya Ramesh Narayanaswamy

Published in: ITC (1983)

Keyphrases

integrated circuit
built in self test
test cases
fault model
fault diagnosis
test sequences
electron beam
printed circuit boards
multiple faults
neural network
image processing
expert systems
control system
signal processing