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Testing for Large ICs.

Yashwant K. MalaiyaAnura P. JayasumanaCarol Q. TongSankaran M. Menon
Published in: VLSI Design (1994)
Keyphrases
  • information retrieval
  • test cases
  • artificial intelligence
  • data sets
  • real world
  • machine learning
  • search engine
  • feature selection
  • database systems
  • bayesian networks
  • video sequences